The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Mar. 31, 2022
Applicant:

Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;

Inventors:

Alvin Kok, Singapore, SG;

Gao Yang, Singapore, SG;

Zheng-Dong Zeng, Singapore, SG;

Jiahao Pan, Singapore, SG;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 34/00 (2016.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 1/000095 (2022.02); A61B 1/00006 (2013.01); A61B 1/0004 (2022.02); A61B 34/25 (2016.02); A61B 90/36 (2016.02); A61B 90/37 (2016.02);
Abstract

An apparatus for processing image data of tissue that includes at least one processor is disclosed. The apparatus is configured for determining a profile from a plurality of profiles, and applying a plurality of settings from the determined profile. The apparatus determines the image based on the applied settings, and outputs data for displaying at least one image. Each profile includes a plurality of settings. Each profile can be configured to enhance and/or suppress anatomical features of the image.


Find Patent Forward Citations

Kok, Alvin. (2026). Image enhancement of anatomical features (U.S. Patent No. 12697010). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12697010

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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