The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Jul. 22, 2021
Applicant:

CI Systems (Israel) Ltd., Migdal Haemek, IL;

Inventor:

Benjamin Brosilow, Ramot Menashe, IL;

Assignee:

CI SYSTEMS (ISRAEL) LTD., Migdal Haemek, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10P 72/00 (2026.01); G01J 5/00 (2022.01); H10P 74/20 (2026.01);
U.S. Cl.
CPC ...
H10P 72/0436 (2026.01); G01J 5/0007 (2013.01); H10P 72/0602 (2026.01); H10P 74/203 (2026.01);
Abstract

Methods, systems, devices, and apparatus measure temperature of a substrate by switching one or more sources between an active state and an inactive state. When in the active state, the one or more sources heat at least one portion of the substrate. When in the inactive state, the one or more sources cause substantially no radiation or a negligible amount of radiation to be generated. A temperature measuring device is synchronized to the switching between the active and inactive states, such that the temperature measuring device measures the temperature of the at least one portion of the substrate substantially only when the one or more sources are in the inactive state.


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