The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Oct. 31, 2023
Applicant:

Nichia Corporation, Anan, JP;

Inventor:

Ryota Funakoshi, Tokushima, JP;

Assignee:

NICHIA CORPORATION, Anan, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 33/62 (2010.01); H10H 20/01 (2025.01); H10H 20/81 (2025.01); H10H 20/813 (2025.01); H10H 20/825 (2025.01);
U.S. Cl.
CPC ...
H10H 20/8215 (2025.01); H10H 20/01335 (2025.01); H10H 20/0137 (2025.01); H10H 20/813 (2025.01); H10H 20/825 (2025.01);
Abstract

A method of manufacturing a nitride semiconductor element includes: providing a first light emission part comprising a first n-side semiconductor layer, a first active layer formed on the first n-side semiconductor layer, and a first p-side semiconductor layer formed on the first active layer; forming a first layer such that the first layer contains an n-type impurity of a first concentration; forming a second layer such that the second layer contains an n-type impurity of a second concentration lower than the first concentration, wherein a thickness of the second layer is greater than a thickness of the first layer; and forming a second light emission part comprising: a second n-side semiconductor layer such that the second n-side semiconductor layer contains an n-type impurity of a third concentration lower than the first concentration and the second concentration, a second active layer, and a second p-side semiconductor layer.


Find Patent Forward Citations

Funakoshi, Ryota. (2026). Nitride semiconductor element and method of manufacturing nitride semiconductor element (U.S. Patent No. 12696585). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12696585

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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