The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Nov. 25, 2025
Applicant:

SR Technologies, Inc., Sunrise, FL (US);

Inventor:

Mark Passler, Rockville, MD (US);

Assignee:

SR Technologies, Inc., Sunrise, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 56/00 (2009.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
H04W 64/00 (2013.01); H04W 24/10 (2013.01); H04W 56/0015 (2013.01);
Abstract

A method for operating a measuring station to generate a circular error probability (CEP) ellipse that encompasses the location of a target wireless station is described. The method includes receiving a plurality of beacons transmitted by the target wireless station. A plurality of Time of Departures (TODs) and a plurality of Time of Arrivals (TOAs) corresponding to the plurality of beacons are identified. A plurality of Times of Flight (TOFs) are determined based on the plurality of TODs and the plurality of TOAs. A plurality of CEP ellipses are calculated based, at least in part, on the plurality of TOFs. It is then determined whether the plurality of CEP ellipses exhibit an orbital radius. If so, a curvature radius of the plurality of CEP ellipses is calculated and an adjusted CEP ellipse is generated encompassing a location of the target wireless station based on the curvature radius.


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