The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Jan. 03, 2024
Applicant:
Airoha Technology Corp., Hsinchu City, TW;
Inventors:
Jeng-Hong Chen, Manhattan Beach, CA (US);
Yun-Xuan Zhang, Taipei City, TW;
Assignee:
Airoha Technology Corp., Hsinchu City, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 17/309 (2015.01); H04L 5/00 (2006.01); H04L 27/20 (2006.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 17/309 (2015.01); H04L 5/0051 (2013.01); H04L 27/2017 (2013.01);
Abstract
A signal quality measurement apparatus includes a processing circuit and a signal quality measurement circuit. The processing circuit receives a reference signal from a first circuit and a signal under test from a second circuit, and refers to the reference signal to derive a signal after processing from the signal under test, wherein the signal under test is derived from predetermined signal processing of the reference signal. The signal quality measurement circuit calculates a signal quality value according to the reference signal and the signal after processing.