The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Feb. 01, 2024
Applicant:

Veeva Systems Inc., Pleasanton, CA (US);

Inventors:

Marius K. Mortensen, Burlington, CA;

Zhen Tan, North York, CA;

Eric Mitchell Woolven, Toronto, CA;

Sandra Komadinic, Hamilton, CA;

Shanul Srivastava, Brampton, CA;

Assignee:

Veeva Systems Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/70 (2018.01); G06F 16/215 (2019.01);
U.S. Cl.
CPC ...
G16H 50/70 (2018.01); G06F 16/215 (2019.01);
Abstract

A method for determining a potential signal includes receiving a request for case data and a statistical value minimum. The method further includes selecting the case data from the central case warehouse based on the request and determining a statistical value based on the case data. The statistical value is at least one of: a case count, a proportional reporting ratio (PRR) value, a chi-squared value, an Empirical Bayes (EB) value, or an Interaction Singal Score (INTSS) value. The method further includes determining the potential signal associated with a specific adverse event code and a medical product identifier based on the statistical value and the statistical value minimum. The method further includes outputting the statistical value and the potential signal via the secure network.


Find Patent Forward Citations

Loading…