The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Jul. 07, 2023
Applicant:

Sandisk Technologies, Inc., Milpitas, CA (US);

Inventors:

Salil Kale, San Jose, CA (US);

Vishwanath Basavaegowda Shanthakumar, Milpitas, CA (US);

Qing Li, Los Gatos, CA (US);

Henry Chin, San Jose, CA (US);

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/44 (2006.01); G11C 29/12 (2006.01); G11C 29/42 (2006.01);
U.S. Cl.
CPC ...
G11C 29/44 (2013.01); G11C 29/1201 (2013.01); G11C 29/42 (2013.01);
Abstract

A memory apparatus and operating method are provided. The apparatus includes memory cells configured to retain a threshold voltage. A control means is configured to read the memory cells using a primary set of read level offsets and determine a value of an error metric for each of the primary set of read level offsets. The control means reads the memory cells using a secondary set of read level offsets based on the value of the error metric for each of the read level offsets of the primary set and determines the value of the error metric for each of the secondary set of read level offsets. The control means is also configured to read the memory cells at an optimum read level determined based on analysis of the value of the error metric for each of the read level offsets of both the primary set and the secondary set.


Find Patent Forward Citations

Kale, Salil. (2026). Binary search bit error rate estimation scan for non-volatile memory apparatus (U.S. Patent No. 12694942). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12694942

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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