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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12694655 B1

PDFFull Text
Date of Patent:
Jul. 28, 2026

Filed:

Apr. 18, 2024

Method and system for separating and recalibrating feature for adversarial robustness

Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Sung-Eui Yoon, Daejeon, KR;

Woo Jae Kim, Daejeon, KR;

Yoonki Cho, Daejeon, KR;

Junsik Jung, Daejeon, KR;

Assignee:

KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon, KR;

Attorneys:

ArentFox Schiff LLP

Joseph M. Maraia

Primary Examiner:

Edward Park

Int. Cl.
CPC ...
G06V 10/80 (2022.01); G06V 10/77 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/80 (2022.01); G06V 10/7715 (2022.01); G06V 10/82 (2022.01);
Abstract

Disclosed is a method and system for separating and recalibrating a feature for adversarial robustness. A feature separation and recalibration method may include disentangling an input feature map into a first feature defined as a robust feature and a second feature defined as a non-robust feature, based on a robustness score; generating a recalibrated feature by recalibrating activation of the second feature; and generating an output feature map by combining the first feature and the recalibrated feature.

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Yoon, Sung-Eui. (2026). Method and system for separating and recalibrating feature for adversarial robustness (U.S. Patent No. 12694655). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12694655

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