The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
May. 15, 2023
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 5/10 (2006.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 5/10 (2013.01); G06T 2207/20052 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/20084 (2013.01);
Abstract
The time-series signal of the sensor is transformed to the spectral intensity by fast Fourier transform (FFT) or the like, and the one-dimensional data of the spectral intensity is generated. A pseudo image is generated, for example, by repeatedly arranging the one-dimensional data in the vertical direction, or by arranging the one-dimensional data for a plurality of sensors in the vertical direction. The state of the facility is identified by analyzing the pseudo image with an image analysis unit such as a convolutional neural network.
Oshima, Takashi. (2026). State detection apparatus (U.S. Patent No. 12694646). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12694646
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile