The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

May. 26, 2023
Applicant:

Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;

Inventors:

Jan Behling, Dortmund, DE;

Mathias Rotgeri, Dortmund, DE;

Jan Sören Emmerich, Dortmund, DE;

Dirk Höning, Dortmund, DE;

Patrick Klokowski, Dortmund, DE;

Christian Hammermeister, Dortmund, DE;

Michael Ten Hompel, Dortmund, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 5/80 (2024.01); G06T 7/521 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06T 5/80 (2024.01); G06T 7/521 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/30252 (2013.01);
Abstract

An apparatus with a processing unit configured to obtain scanning information of a two-dimensional scan of a surface is described herein. The processing unit is further configured to obtain positional information indicating an inclination of a capturing unit with respect to the surface, said capturing unit providing the two-dimensional scan and to evaluate the scanning information using the positional information with respect to a localization of the capturing unit relative to the surface.


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