The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Feb. 18, 2021
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Yasunori Babazaki, Tokyo, JP;
Hiroyoshi Miyano, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/10 (2022.01); G06T 7/73 (2017.01); G06V 10/44 (2022.01); G06V 10/762 (2022.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06V 10/44 (2022.01); G06V 10/762 (2022.01); G06V 40/10 (2022.01); G06T 2207/30196 (2013.01); G06T 2207/30242 (2013.01);
Abstract
An estimation deviceX mainly includes a feature point estimation meansX, a representative point candidate determination meansX, and a representative point estimation meansX. The feature point estimation meansX estimates plural feature points relating to an object. The representative point candidate determination meansX determines plural representative point candidates that are candidates of a representative point of the object based on the plural feature points. The representative point estimation meansX estimates the representative point based on the plural representative point candidates.