The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Sep. 22, 2023
Applicant:

Screen Holdings Co., Ltd., Kyoto, JP;

Inventors:

Toshiyuki Okayama, Kyoto, JP;

Yoshinori Shimada, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 9/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 9/20 (2013.01); G06T 2207/20081 (2013.01);
Abstract

An encoding step and an image selection step are performed by a computer. In the encoding step, a plurality of partial images Dof an object are input to a learned VAE model M, and the plurality of partial images Dare encoded to a plurality of latent variables in a multi-dimensional latent space. In the image selection step, one or more partial images Dthat are likely to include an alignment mark are selected on the basis of a distribution of the plurality of latent variables in the latent space. Thus, a partial image that is likely to include an alignment mark is automatically detected by the computerwith the use of the VAE model M. This can lighten a burden on an operator who searches for an alignment mark.


Find Patent Forward Citations

Okayama, Toshiyuki. (2026). Mark detection method and computer program (U.S. Patent No. 12694542). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12694542

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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