The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Mar. 25, 2022
Konica Minolta, Inc., Tokyo, JP;
Konica Minolta, Inc., Tokyo, JP;
Abstract
A wave motion analysis devicethat detects a defect of an inspection object on the basis of a reflection wave obtained from the inspection object, and includes a multiple reflection area extraction unitthat acquires tomographic data generated on the basis of the reflection wave and extracts, from the tomographic data, a multiple reflection area corresponding to a depth range deeper than a depth at which a real image of the inspection object is able to be detected and being an area in which a multiple reflection signal is able to be mainly detected, and a detection unitthat detects a multiple reflection image corresponding to the defect of the inspection object from the extracted multiple reflection area.