The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Sep. 13, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Dennis Wei, Sunnyvale, CA (US);

Rahul Nair, Dublin, IE;

Amit Dhurandhar, Yorktown Heights, NY (US);

Kush Raj Varshney, Chappaqua, NY (US);

Elizabeth Daly, Dublin, IE;

Moninder Singh, Farmington, CT (US);

Michael Hind, Cortlandt Manor, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/01 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/01 (2023.01);
Abstract

Techniques regarding determining sufficiency of one or more machine learning models are provided. For example, one or more embodiments described herein can comprise a system, which can comprise a memory that can store computer executable components. The system can also comprise a processor, operably coupled to the memory, and that can execute the computer executable components stored in memory. The computer executable components can comprise a measurement component that measures maximum deviation of a supervised learning model from a reference model over a certification set and an analysis component that determines sufficiency of the supervised learning model based at least in part on the maximum deviation.


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