The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

May. 21, 2021
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Haodong Qiu, Kyoto, JP;

Shiori Nagai, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G01N 21/35 (2014.01); G06F 7/00 (2006.01); G06N 3/0464 (2023.01);
U.S. Cl.
CPC ...
G06N 3/0464 (2023.01); G01N 21/35 (2013.01); G01N 2021/3595 (2013.01);
Abstract

A data analysis apparatus, a data analysis method, a method of generating a trained model, a system, and a program that allow highly accurate and easy analysis of an FT-IR spectrum are provided. The data analysis apparatus includes an obtaining unit that obtains an analysis target which is an FT-IR spectrum, a trained model, and an analyzer that inputs the analysis target to the trained model. The trained model is machine-trained so as to output, when the trained model receives input of an FT-IR spectrum, information indicating whether or not the inputted FT-IR spectrum includes a peak derived from a trained atomic group. The trained atomic group includes an atomic group containing at least three atoms.


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Qiu, Haodong. (2026). Data analysis apparatus, data analysis method, method of generating trained model, system, and program (U.S. Patent No. 12694273). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12694273

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