The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Dec. 02, 2020
Applicant:

Ultimaker B.v., Utrecht, NL;

Inventor:

Tim Kuipers, Utrecht, NL;

Assignee:

Ultimaker B.V., Zaltbommel, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/17 (2020.01); B29C 64/393 (2017.01); G05B 19/4099 (2006.01); G05B 19/4103 (2006.01);
U.S. Cl.
CPC ...
G06F 30/17 (2020.01); B29C 64/393 (2017.08); G05B 19/4099 (2013.01); G05B 19/4103 (2013.01); G05B 2219/49023 (2013.01);
Abstract

The invention relates to a method of determining toolpaths for an infill structure for a digital 3D model. The invention provides for a framework for planning toolpaths with control over the adaptive width for minimizing over- and underfill and introduce a beading scheme which reduces the bead width variation compared to the state of the art. We show that this framework supports various control schemes (so-called 'beading schemes') for determining the bead spacing and extrusion widths. Furthermore we present an approach to accurately realize adaptive bead width. The proposed method provides for a geometric framework allowing various adaptive bead width control schemes used to generate contour-parallel toolpaths which minimize under- and overfill.


Find Patent Forward Citations

Kuipers, Tim. (2026). Method of determining toolpaths for an infill structure for a digital 3d model (U.S. Patent No. 12694171). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12694171

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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