The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
May. 15, 2024
Sandisk Technologies, Inc., Milpitas, CA (US);
Sandisk Technologies, Inc., Milpitas, CA (US);
Abstract
A bit error rate (BER) estimation scan (BES) typically uses static read thresholds during the scan process. These fixed thresholds might not adapt to variations in memory cell characteristics, leading to suboptimal BER estimation and error correction. The embodiments presented herein can be used to address this problem by providing a hybrid variation of BES and on-chip (e.g., in a controller ASIC) threshold voltage (Vth) tracking. In one example, BER results from BES failing pages are used to update Vth tracking parameters. In this way, BER results can be used to identify the most unreliable memory pages, and the Vth tracking parameters can be updated to reduce the BER for those pages. Other examples are provided.