The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Oct. 29, 2024
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Hailan Dong, Chengdu, CN;

Chi Chen, Chengdu, CN;

Huijuan Fan, Chengdu, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0616 (2013.01); G06F 3/0653 (2013.01); G06F 3/0659 (2013.01); G06F 3/0689 (2013.01);
Abstract

Techniques are directed to wear leveling. Such techniques involve: determining, at least based on the type information of each redundant array of independent disks (RAID) group in a plurality of RAID groups, the write loss of each of the RAID groups. Such techniques further involve: determining the wear status of each of the RAID groups according to the status information and write loss of each of the RAID groups. Such techniques further involve: transferring at least a portion of data and/or a write task of a first RAID group to a second RAID group based on the write loss and the wear status of each of the RAID groups. With such wear leveling techniques, wear caused by write tasks can be evenly distributed among the RAID groups, so that the degree of wear among the RAID groups is more leveled.


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