The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Jul. 01, 2022
Applicant:
Imec Vzw, Leuven, BE;
Inventor:
Pol Van Dorpe, Spalbeek, BE;
Assignee:
IMEC VZW, Leuven, BE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/04 (2006.01); G01N 21/47 (2006.01); G03H 1/00 (2006.01); G03H 1/08 (2006.01); G03H 1/22 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0443 (2013.01); G01N 21/47 (2013.01); G03H 1/0866 (2013.01); G03H 1/22 (2013.01); G03H 2001/005 (2013.01);
Abstract
According to an aspect of the present inventive concept there is provided an imaging system for imaging of a sample, comprising a light source, an interference filter and a detector, the light source generates illumination light of a single wavelength to induce elastic scattering of the light by the sample, the interference filter selectively reduces transmittance of light having an incident angle on the interference filter corresponding to non-scattered light, the detector is configured to detect a two-dimensional representation of the elastically scattered light transmitted by the interference filter.