The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Jun. 13, 2023
Evident Corporation, Tatsuno-machi, JP;
Yoshihiro Kazama, Kamiina-gun, JP;
Kenichi Kusaka, Kamiina-gun, JP;
Evident Corporation, Nagano, JP;
Abstract
A microscope system includes an eyepiece-side observation optical system that forms an image of a sample on an object side of an eyepiece, a camera-side observation optical system that forms an image of the sample on an image sensor, a diaphragm that limits a numerical aperture on the emission side of the camera-side observation optical system, and a processor that analyzes the image of the sample captured by the image sensor. In a case where a numerical aperture on an object side of an objective lens is denoted by NA, the numerical aperture on the emission side of the camera-side observation optical system determined by a light flux emitted from the camera-side observation optical system toward the image sensor at capturing the image is denoted by NA', and a total magnification of the camera-side observation optical system is denoted by M1, the following is satisfied.1×NA′<NA (1)