The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Jul. 24, 2023
Mitsubishi Electric Corporation, Tokyo, JP;
Takanori Yamauchi, Tokyo, JP;
Junya Nishioka, Tokyo, JP;
Hiroki Goto, Tokyo, JP;
Naoki Suzuki, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;
Abstract
An optical measurement device is a measurement device that measures a distance to a target using light, and includes: a split unit to split light into reference light and measurement light; an adjustment unit to split the reference light into a plurality of beams of reference light having respective different light path lengths; an interference unit to multiplex two of reflection light obtained by reflection when a target is irradiated with the measurement light, and the plurality of beams of reference light to obtain interference light; and a processing unit to calculate a light path length difference on a basis of a frequency of the interference light, and the optical measurement device calculates light path length differences of the plurality of beams of reference light, so that it is possible to measure the distance to the target even when the distance to the target significantly fluctuates.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile