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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12693412 B1

PDFFull Text
Date of Patent:
Jul. 28, 2026

Filed:

Oct. 30, 2023

Method and apparatus for determining sensor integrity using signals from an adjacent sensor

Applicants:

Hyundai Motor Company, Seoul, KR;

Kia Corporation, Seoul, KR;

Inventors:

Chan Mi Seo, Bucheon-si, KR;

Hyeon Jeong Jeon, Hanam-si, KR;

Seung Hoon Jeon, Incheon, KR;

Dong Hyuk Kim, Incheon, KR;

Assignees:

HYUNDAI MOTOR COMPANY, Seoul, KR;

KIA CORPORATION, Seoul, KR;

Attorney:

Lempia Summerfield Katz LLC

Primary Examiner:

Abdallah Abulaban

Assistant Examiner:

Amie M Ndure

Int. Cl.
CPC ...
G01S 15/931 (2020.01); G01S 7/52 (2006.01);
U.S. Cl.
CPC ...
G01S 15/931 (2013.01); G01S 7/52004 (2013.01); G01S 2015/932 (2013.01);
Abstract

An apparatus for determining integrity of a sensor includes a signal transmission unit configured to sequentially operate each of a plurality of ultrasonic sensors mounted on a vehicle to generate respective output signals. The apparatus also includes a signal sensing unit configured to acquire a received value of an adjacent ultrasonic sensor adjacent to each of the plurality of ultrasonic sensors which generate the respective output signals. The apparatus further includes an anomaly determining unit configured to determine whether the received value is abnormal. The apparatus additionally includes a determination-result processing unit configured to perform a response for each of the ultrasonic sensors according to a result of determining anomaly.

Find Patent Forward Citations

Seo, Chan. (2026). Method and apparatus for determining sensor integrity using signals from an adjacent sensor (U.S. Patent No. 12693412). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12693412

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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