The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Nov. 03, 2023
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Kang Min Bae, Daejeon, KR;

Hankyeol Moon, Daejeon, KR;

Song Min Kim, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/34 (2006.01); G01S 7/35 (2006.01); G01S 13/02 (2006.01); G01S 13/32 (2006.01); G01S 13/75 (2006.01); G01S 13/82 (2006.01);
U.S. Cl.
CPC ...
G01S 13/34 (2013.01); G01S 13/325 (2013.01); G01S 13/758 (2013.01); G01S 13/825 (2013.01); G01S 7/356 (2021.05); G01S 2013/0263 (2013.01);
Abstract

Provided are a tag, interrogator, and system for performing position measurement based on backscatter in a millimeter-wave band. In detail, provided is a tag including a planar Van Atta array antenna, a frequency-shift keying (FSK) modulator connected to the planar Van Atta array antenna, and at least one bias circuit connected to the FSK modulator, wherein the FSK modulator is configured to, based on an interrogation signal being received by the planar Van Atta array antenna, modulate the interrogation signal based on a control signal supplied through the at least one bias circuit, and output the modulated interrogation signal in a direction from which the interrogation signal is received, through the planar Van Atta array antenna.


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