The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Sep. 05, 2023
Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;
Yumiko Kato, Osaka, JP;
Kohei Kikuchi, Osaka, JP;
Kenji Narumi, Osaka, JP;
Hiroyuki Takagi, Osaka, JP;
Yasuhisa Inada, Osaka, JP;
Abstract
A measurement apparatus includes a light source, an interference optical system, a photodetector, a processing circuit, and a storage apparatus. The interference optical system splits light emitted from the light source into reference light and output light and generates interfering light between reflected light resulting from reflection of the output light on an object and the reference light. The photodetector outputs a detection signal corresponding to strength of the interfering light. The processing circuit modulates the frequency of the light outputted from the light source with a period including an up-chirp duration in which the frequency increases and a down-chirp duration in which the frequency decreases. The storage apparatus stores first correction data for the up-chirp duration and second correction data for the down-chirp duration. The processing circuit determines distance or velocity based on a signal obtained by correcting the detection signal based on the first or second correction data.