The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Sep. 28, 2022
Keysight Technologies, Inc., Santa Rosa, CA (US);
Choo Sheong Ding, Singapore, SG;
Yong Kheng Seo, Singapore, SG;
Hare Ganesh Kandasamy Soundararajan, Singapore, SG;
Hau-Jiun Chen, Singapore, SG;
KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);
Abstract
A method is provided for automating testing of a SUT. The method includes providing an interface on a computing device to test instruments configured for testing the SUT, to software applications, and/or to browsers respectively running on the test instruments; providing an RPA application and an OCR application on the computing device; controlling the test instruments via the interface to perform a measurement of the SUT via the interface using the RPA application according to a predetermined test procedure; receiving test data from the test instruments via the interface in response to the measurement; capturing the test data and translating the captured test data to readable data using the OCR application; repeating the controlling of the test instruments, the receiving and capturing of the test data, and the translating of the captured test data to acquire aggregated test data; and generating a report populated with the aggregated test data.