The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Oct. 25, 2023
Applicant:
Sumitomo Electric Industries, Ltd., Osaka, JP;
Inventors:
Kosuke Fujii, Osaka, JP;
Koichi Koyama, Yokohama, JP;
Assignee:
SUMITOMO ELECTRIC INDUSTRIES, LTD., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01B 11/06 (2006.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 1/06794 (2013.01); G01B 11/06 (2013.01); G01R 1/06711 (2013.01); G01R 31/2637 (2013.01);
Abstract
A testing device includes a contactless measurement unit configured to measure a thickness of a test object and a probe needle configured to move by a distance in accordance with the thickness measured by the measurement unit to come into contact with an electrode of the test object.
Quick Actions:
Fujii, Kosuke. (2026). Testing device, testing method, and non-transitory storage medium storing testing program (U.S. Patent No. 12693313). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12693313
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile