The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Feb. 07, 2023
Applicant:

Schlage Lock Company Llc, Carmel, IN (US);

Inventors:

Daniel Langenberg, Zionsville, IN (US);

Nathanael L. Thomas, Carmel, IN (US);

Assignee:

Schlage Lock Company LLC, Carmel, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/44 (2006.01); G01C 19/5776 (2012.01); G01N 29/14 (2006.01); G01P 13/00 (2006.01); G01P 15/08 (2006.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G01N 29/4454 (2013.01); G01C 19/5776 (2013.01); G01N 29/14 (2013.01); G01N 29/4481 (2013.01); G01P 13/00 (2013.01); G01P 15/0802 (2013.01); G06N 3/08 (2013.01); G01N 2291/0258 (2013.01);
Abstract

A method according to one embodiment includes receiving sensor data from a plurality of sensors of a door device associated with a door, analyzing the sensor data to determine behavior data indicative of a behavior of the door device, and comparing the behavior data to a plurality of representative data associated with a plurality of door faults to determine a corresponding likelihood that the sensor data corresponds with each of the door faults.


Find Patent Forward Citations

Langenberg, Daniel. (2026). Door fault identification (U.S. Patent No. 12693272). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12693272

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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