The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

May. 31, 2022
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Osamu Furuhashi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/2257 (2018.01); H01J 49/00 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2257 (2013.01); H01J 49/0031 (2013.01); H01J 49/0459 (2013.01);
Abstract

A surface analysis apparatus includes: an ion irradiation unit configured to irradiate a surface of a solid sample with an ion stream of a specific ion species having a preset value of kinetic energy at a predetermined incident angle; an observation unit configured to observe scattered ions that originate from the ion stream and have undergone a charge transfer reaction with an atom or molecule present on a surface of the solid sample; and an information calculation unit configured to obtain information on electrical properties or physical properties on a surface of the solid sample on the basis of an observation result of the scattered ions in the observation unit. As a result, it is possible to efficiently acquire, in a short time, the distribution of the information on the electrical properties or physical properties such as the surface potential of the solid sample.


Find Patent Forward Citations

Furuhashi, Osamu. (2026). Surface analysis method and surface analysis apparatus (U.S. Patent No. 12693248). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12693248

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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