The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Jul. 07, 2022
Applicants:

Nuctech Company Limited, Beijing, CN;

Tsinghua University, Beijing, CN;

Inventors:

Zhiqiang Chen, Beijing, CN;

Li Zhang, Beijing, CN;

Qingping Huang, Beijing, CN;

Yong Zhou, Beijing, CN;

Zhenhua Zhao, Beijing, CN;

Hui Ding, Beijing, CN;

Xin Jin, Beijing, CN;

Chao Ji, Beijing, CN;

Assignees:

Nuctech Company Limited, Beijing, CN;

Tsinghua University, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 2223/308 (2013.01); G01N 2223/3305 (2013.01); G01N 2223/3308 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01); G01N 2223/5015 (2013.01);
Abstract

A ray scanning apparatus, including: a conveying device; a ray source assembly including a plurality of ray source modules arranged around the scanning area in a non-enclosed structure opened on one side of the scanning area; and a detector assembly including a plurality of detector sets arranged around the scanning area in a non-enclosed structure opened on one side of the scanning area, where the opening of the non-enclosed structure of the ray source assembly is opposite to the opening of the non-enclosed structure of the detector assembly, the plurality of detector sets are fixed in a same plane perpendicular to the conveying direction of the object under inspection, and the plurality of ray source modules of the ray source assembly are arranged in a plurality of different planes perpendicular to the conveying direction of the object under inspection.


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