The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Dec. 09, 2024
Hexagon Innovation Hub Gmbh, Heerbrugg, CH;
Bernd Reimann, Heerbrugg, CH;
Fabian Braun, Diepoldsau, CH;
Alexandre Heili, Altstätten, CH;
Michael Zapp, Saarlouis, DE;
HEXAGON INNOVATION HUB GMBH, Heerbrugg, CH;
Abstract
A method for optical inspection of a feature of interest on a workpiece using an optical measuring system comprising at least one camera and a plurality of light sources, the method comprising: simulating illumination of a workpiece model; training, based on synthetic images obtained from the simulated illumination, an AI agent or an ML model to automatically control the plurality of light sources; inferring, in at least one image captured by the at least one camera, properties of the feature of interest on the workpiece; the trained AI agent controlling the plurality of light sources to select a light setting for illuminating the feature of interest; and optically inspecting the illuminated feature of interest while it is illuminated with the selected light setting.