The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Nov. 14, 2023
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Akifumi Sangu, Yongin-si, KR;

Se-Kwang Han, Yongin-si, KR;

Hyeran Ko, Yongin-si, KR;

Jaemin Son, Yongin-si, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/94 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/94 (2013.01);
Abstract

An inspection apparatus includes a light source which radiates a beam, a first lens disposed between the inspection object and the light source with a first opening defined therethrough in a first direction, a second lens disposed between the inspection object and the first lens with a second opening defined therethrough in the first direction to overlap the first opening, an inspection unit disposed to be spaced apart from the inspection object with the first lens interposed therebetween and including an incidence portion disposed to overlap the first opening and the second opening on a plane, and a driving unit which adjusts a distance between the first lens and the inspection object or a distance between the second lens and the inspection object.


Find Patent Forward Citations

Sangu, Akifumi. (2026). Inspection apparatus (U.S. Patent No. 12693229). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12693229

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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