The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Jul. 09, 2024
Applicants:

Imec Vzw, Leuven, BE;

Universiteit Gent, Ghent, BE;

Inventors:

Yanlu Li, Kessel-Lo, BE;

Roeland Baets, Deinze, BE;

Assignees:

IMEC VZW, Leuven, BE;

Universiteit Gent, Ghent, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); G01F 1/661 (2022.01); G01M 3/04 (2006.01); G01N 21/17 (2006.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01F 1/661 (2013.01); G01N 21/85 (2013.01); G01M 3/04 (2013.01); G01N 2021/1797 (2013.01);
Abstract

A system for open-path sensing of a property of a fluid in an environment comprises: a sensing light source; a pumping light source for outputting a pumping beam into the environment for inducing a change of light propagation characteristics of the fluid; wherein the system outputs a probing beam and a reference beam into the environment, such that the probing beam has a larger intersection with the pumping beam than the reference beam; wherein a first interferometer detects a phase shift and/or an intensity change of a received probing beam; and wherein a second interferometer detects a phase shift and/or an intensity change of a received reference beam.


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