The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Feb. 28, 2023
Kabushiki Kaisha Toshiba, Tokyo, JP;
Wataru Watanabe, Tokyo, JP;
Keisuke Kawauchi, Kawasaki Kanagawa, JP;
Takayuki Itoh, Kawasaki Kanagawa, JP;
Jumpei Ando, Yokohama Kanagawa, JP;
Toshiyuki Ono, Kawasaki Kanagawa, JP;
KABUSHIKI KAISHA TOSHIBA, Kawasaki, JP;
Abstract
According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires, from manufacturing data related to a plurality of products, first manufacturing data under a first acquisition condition. The first manufacturing data includes manufacturing condition data related to a manufacturing condition for each of the products and quality data related to quality for each of the products. The processing circuitry determines a second acquisition condition different from the first acquisition condition based on the first manufacturing data. The processing circuitry acquires second manufacturing data including the manufacturing condition data and the quality data from the manufacturing data under the second acquisition condition. The processing circuitry calculates an analysis result of a relationship between the manufacturing condition data and the quality data by analyzing the second manufacturing data. The processing circuitry generates output data including the analysis result.