The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Mar. 08, 2024
Endress+hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Mary Lewis, Ann Arbor, MI (US);
Jeremy David Preister, Fenton, MI (US);
Ian Lewis, Ann Arbor, MI (US);
Endress+Hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Abstract
A measurement system for a focal distance measurement of an optic includes: a translation stage including a base and platform configured to translate in linear motion relative to each other in an automated manner driven by a linear actuator; a reference material disposed on the translation stage and having a surface opposite the optic to be measured; a measuring device configured to measure a gap between the surface of the reference material and a distal tip of the optic in an automated manner; a spectrometer in optical communication with the optic; and a controller configured to operate the translation stage, the measuring device, and the spectrometer and to determine a focal distance of the optic based on a spectral characteristic of a measurement spectrum and on a final gap between the surface of the reference material and the distal tip of the optic at which the spectral characteristic is determined.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile