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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12693163 B1

PDFFull Text
Date of Patent:
Jul. 28, 2026

Filed:

Jun. 29, 2023

Wavelength measurement chip and wavelength measurement system

Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Cheewei Lee, Shenzhen, CN;

Chao Pan, Shenzhen, CN;

Stevanus Darmawan, Chiba, JP;

Shaowu Wang, Dongguan, CN;

Qian Wang, Shenzhen, CN;

Huaqiang Qin, Shenzhen, CN;

Assignee:

HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;

Attorney:

Rimon PC

Primary Examiner:

Michelle M Iacoletti

Assistant Examiner:

Mohamed undefined Doumbia

Int. Cl.
CPC ...
G01J 3/45 (2006.01); G01J 3/02 (2006.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
G01J 3/45 (2013.01); G01J 3/0229 (2013.01); G02B 27/1006 (2013.01);
Abstract

An optical chip and a wavelength measurement system are disclosed. The optical chip includes an optical splitter configured to receive a first electromagnetic wave signal, and divide the first electromagnetic wave signal into two electromagnetic wave signals to be output. The optical chip also includes a first interferometer and a second interferometer, where the optical splitter, the first interferometer, and the second interferometer are disposed in sequential order. The first interferometer and the second interferometer are configured to receive one of the two electromagnetic wave signals, so that the one electromagnetic wave signal is interfered twice, to output a plurality of second electromagnetic wave signals. Another wave signal of the two electromagnetic wave signals is output as a third electromagnetic wave signal, and the second electromagnetic wave signal and the third electromagnetic wave signal may be used to obtain wavelength information of the first electromagnetic wave signal through optical-electrical conversion.

Find Patent Forward Citations

Lee, Cheewei. (2026). Wavelength measurement chip and wavelength measurement system (U.S. Patent No. 12693163). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12693163

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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