The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Jan. 05, 2023
Applicant:

Sato Holdings Kabushiki Kaisha, Tokyo, JP;

Inventors:

Kevin Lermond, Charlotte, NC (US);

Jiro Miura, Tokyo, JP;

Hiroaki Horigome, Tokyo, JP;

Peter Fullerton, Charlotte, NC (US);

Assignee:

SATO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); B65C 1/02 (2006.01); G06T 7/70 (2017.01); G06V 10/98 (2022.01);
U.S. Cl.
CPC ...
B25J 9/1697 (2013.01); B65C 1/02 (2013.01); G06T 7/70 (2017.01); G06V 10/993 (2022.01); G06T 2200/24 (2013.01);
Abstract

Systems for automatic labeling and methods for using automatic labeling systems are disclosed. A system can include a camera, and a controller including one or more processors coupled to one or more memories. The system can acquire an image of a sample object via the camera, and identify first and second tokens depicted in the image or positioned over the image of the sample object. The system can designate a location of the first token as a target label location at which a label is to be applied to the sample object, and designate a location of the second token as an identifying information location that is identifiable to determine an orientation of the sample object.


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