The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Apr. 14, 2021
Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventors:

Tatsuya Onishi, Hamamatsu, JP;

Toshiyasu Suyama, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/42 (2024.01); G06T 5/70 (2024.01);
U.S. Cl.
CPC ...
A61B 6/42 (2013.01); A61B 6/482 (2013.01); G06T 5/70 (2024.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20182 (2013.01);
Abstract

A control device includes an input unit configured to accept an input of condition information indicating either operating conditions of a source of X-rays when the X-rays are radiated to capture an image of a target object or imaging conditions during capturing an image of the target object, a calculation unit configured to calculate average energy of the X-rays passing through the target object on the basis of the condition information, and a narrowing unit configured to narrow down candidates for a trained model from a plurality of trained models constructed through machine training in advance using image data on the basis of the average energy.


Find Patent Forward Citations

Onishi, Tatsuya. (2026). Radiography method, trained model, radiography module, radiography program, radiography system, and machine learning method (U.S. Patent No. 12690827). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12690827

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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