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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12689836 B1

PDFFull Text
Date of Patent:
Jul. 21, 2026

Filed:

Feb. 24, 2023

Light-field imaging based on tilt-aberration

Applicant:

Danmarks Tekniske Universitet, Kongens Lyngby, DK;

Inventors:

Hugh Simons, Kongens Lyngby, DK;

Mario Alejandro Beltran, Kongens Lyngby, DK;

Assignee:

Danmarks Tekniske Universitet, Kongens Lyngby, DK;

Attorney:

BLANK ROME LLP

Primary Examiner:

Antoinette T Spinks

Int. Cl.
CPC ...
H04N 23/951 (2023.01); G01J 9/00 (2006.01); G02B 21/00 (2006.01); G02B 21/14 (2006.01); G02B 21/36 (2006.01); H04N 23/957 (2023.01);
U.S. Cl.
CPC ...
H04N 23/951 (2023.01); G01J 9/00 (2013.01); G02B 21/0008 (2013.01); G02B 21/14 (2013.01); G02B 21/367 (2013.01); H04N 23/957 (2023.01); G01J 2009/002 (2013.01);
Abstract

A method, imaging system and computer program product for obtaining a transverse phase gradient of a wave field from at least a first and a second wavefield intensity map includes the steps of; capturing at a first incoherent tilt aberration the first wave field intensity map of a target at a first degree of incoherent tilt aberration, using a filter positioned between a source of electromagnetic radiation and an electromagnetic radiation detector capturing said first wave field intensity map; capturing at a second and different incoherent tilt aberration said second wave field intensity map of said target at a second degree of incoherent tilt aberration, using a filter positioned between a source of electromagnetic radiation and an electromagnetic radiation detector capturing the second wave field intensity map; determining the transverse phase gradient on the basis of at least a difference of logarithms of wavefield intensity maps divided by the magnitude of the difference between the first incoherent tilt aberration and the second incoherent tilt aberration.

Find Patent Forward Citations

Simons, Hugh. (2026). Light-field imaging based on tilt-aberration (U.S. Patent No. 12689836). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12689836

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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