The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Mar. 11, 2024
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Hitoshi Sakurabu, Saitama, JP;

Hideaki Kokubun, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/67 (2023.01); G02B 7/34 (2021.01); G06V 10/82 (2022.01); H04N 23/61 (2023.01);
U.S. Cl.
CPC ...
H04N 23/672 (2023.01); G06V 10/82 (2022.01); H04N 23/61 (2023.01);
Abstract

There is provided a detection method used in an imaging apparatus including an imaging element that has a first pixel for generating a first signal and second and third pixels for generating second and third signals for detecting a phase difference, and a memory that stores a machine-trained model, the detection method including: an input step of inputting a second image based on the second signal, a third image based on the third signal, or a fourth image based on the second signal and the third signal to the model as an input image; a subject detection step of detecting a subject included in a first image generated by the first signal, through the model on which the input step is executed; and a focusing position detection step of detecting a focusing position with respect to the subject, through the model on which the input step is executed.


Find Patent Forward Citations

Loading…