The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Jan. 09, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventor:

Akio Shirasaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/065 (2006.01); H01S 5/026 (2006.01); H01S 5/0683 (2006.01);
U.S. Cl.
CPC ...
H01S 5/0265 (2013.01); H01S 5/0651 (2013.01); H01S 5/0683 (2013.01); H01S 2301/16 (2013.01);
Abstract

An inspection method for inspecting a semiconductor laser device integrated with a semiconductor laser, an electroabsorption modulator for input the output of the semiconductor laser, and a photodetector for detecting intensity of part of the laser light output from the semiconductor laser includes a step of acquiring a transverse-mode light output characteristic that is a relationship between an injection current to the semiconductor laser and the output of the photodetector; a step of applying a reverse bias voltage to the electroabsorption modulator and acquiring a total light output characteristic that is a relationship between the injection current to the semiconductor laser and a photocurrent output from the electroabsorption modulator; and a step of comparing the total light output characteristic with the transverse-mode light output characteristic, thereby to determine whether or not the semiconductor laser device under inspection is abnormal in the transverse mode.


Find Patent Forward Citations

Shirasaki, Akio. (2026). Inspection method for semiconductor laser device and inspection device for semiconductor laser device (U.S. Patent No. 12689180). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12689180

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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