The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

May. 02, 2025
Applicant:

Resonac Hard Disk Corporation, Chiba, JP;

Inventor:

Masaaki Yanagisawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/31 (2006.01); G11B 9/02 (2006.01); G11C 11/22 (2006.01); G11C 11/56 (2006.01); G11B 5/00 (2006.01);
U.S. Cl.
CPC ...
G11B 5/3163 (2013.01); G11B 9/02 (2013.01); G11C 11/22 (2013.01); G11C 11/221 (2013.01); G11C 11/5657 (2013.01); G11B 2005/0002 (2013.01); Y10T 29/49032 (2015.01);
Abstract

A manufacturing method of a conductive probe that is configured to write information to and read information from a ferroelectric recording medium is provided. The manufacturing method includes: forming, on a conductive material, an insulating layer by oxidizing the conductive material; forming an isolation layer on the insulating layer; applying a photoresist on the isolation layer; forming a hole in the photoresist; etching in the hole to the conductive material; depositing metal on a surface of the conductive material in the hole, thereby obtaining a needle-shaped electrode; and removing the isolation layer. A portion of the needle-shaped electrode protrudes from the surface of the insulating layer.


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Yanagisawa, Masaaki. (2026). Manufacturing method of conductive probe (U.S. Patent No. 12688868). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12688868

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