The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Jun. 15, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Ryo Mizushima, Tokyo, JP;

Tomohiko Yagyu, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/10 (2013.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01);
Abstract

Grouping means groups a plurality of hosts included in a system to be analyzed into a plurality of groups each including one or more hosts. The grouping means uses measure-related information including information related to measures planned for the system to be analyzed to group the plurality of hosts into the plurality of groups. Virtual analysis element generation means generates a virtual analysis element for each of the plurality of groups. Virtual model generation means generates a virtual model used for risk analysis that includes the virtual analysis elements generated by the virtual analysis element generation means. Analysis means analyzes the risks included in the system to be analyzed using the virtual model generated by the virtual model generation means.


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