The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Sep. 28, 2021
Applicant:

Evident Corporation, Nagano, JP;

Inventor:

Hidehiro Miyayashiki, Akishima, JP;

Assignee:

Evident Corporation, Nagano, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/10 (2017.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01);
Abstract

A measurement method includes a generation step, a region detection step, an image display step, a point input step, and a measurement step. Three-dimensional image data including three-dimensional coordinates of two or more points on a subject are generated in the generation step. Two or more feature regions on the subject are detected on the basis of the three-dimensional image data in the region detection step. An image of the two or more feature regions is displayed on a display in the image display step. A point on the subject is accepted through an input device in the point input step. A size of the subject is measured on the basis of three-dimensional coordinates of two or more points on the subject.


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