The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Oct. 26, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yujie Lu, Vernon Hills, IL (US);

Liang Cai, Vernon Hills, IL (US);

Jian Zhou, Buffalo Grove, IL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 12/10 (2026.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 12/10 (2026.01); G06T 7/0012 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30008 (2013.01);
Abstract

According to some embodiments, a method comprises obtaining a set of projection data acquired from a CT scan of an object; generating, based on the set of projection data, one or more sets of preliminary scattering data; and performing X-ray scatter correction by inputting the obtained set of projection data and the generated one or more sets of preliminary scattering data into a trained machine-learning model for extracting X-ray scatter components from the set of projection data.


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