The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Nov. 11, 2022
Applicants:

Interdigital Vc Holdings, Inc., Wilmington, DE (US);

New York University, New York, NY (US);

Inventors:

Ruoyu Wang, New York, NY (US);

Chen Feng, Scotch Plains, NJ (US);

Dong Tian, Boxborough, MA (US);

Assignees:

INTERDIGITAL VC HOLDINGS, INC., Wilmington, DE (US);

NEW YORK UNIVERSITY, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/12 (2017.01); G06T 3/40 (2024.01); G06T 7/187 (2017.01); G06T 7/64 (2017.01);
U.S. Cl.
CPC ...
G06T 7/12 (2017.01); G06T 3/40 (2013.01); G06T 7/187 (2017.01); G06T 7/64 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01);
Abstract

Points are grouped from a point cloud using Concavity-induced Distance (CID). First, a set of seed points is sampled from the input point cloud. Then a grouping of points is conducted based on a nearest neighbor search computed using CID. These two steps enable two novel solutions in point cloud segmentation and scene abstraction. In one embodiment, CID is determined between two points residing within an object surface. In a second embodiment, a CID is determined between groups of points.


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