The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2026
Filed:
May. 11, 2023
Samsung Electronics Co., Ltd., Suwon-si, KR;
Hwiryong Jung, Suwon-si, KR;
Nahyup Kang, Suwon-si, KR;
Hanjun Kim, Suwon-si, KR;
Jaeyoung Moon, Suwon-si, KR;
Hyeonseung Yu, Suwon-si, KR;
Juyoung Lee, Suwon-si, KR;
Inwoo Ha, Suwon-si, KR;
Seokpyo Hong, Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
An adaptive super sampling method includes: rendering frames of a three-dimensional (3D) model, the frames including a current frame and a previous frame preceding the current frame; determining motion vectors indicating a correspondence relationship between pixels in the current frame and pixels in the previous frame; generating a geometric identifier maps (G-ID maps) respectively corresponding to the current frame and the previous frame based on 3D geometrical properties associated with the pixels in the current frame and the previous frame; based on the motion vectors and the G-ID maps, generating an artifact map predicting where artifacts will occur from inter-frame super sampling of the current frame; and performing adaptive super sampling on the current frame based on the artifact map.