The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Apr. 14, 2025
Applicant:

Lablup Inc., Seoul, KR;

Inventors:

Joon Gi Kim, Seoul, KR;

Jeong Kyu Shin, Seoul, KR;

Assignee:

LABLUP INC., Seoul, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/20 (2006.01); G06N 3/08 (2023.01); G06T 1/20 (2006.01); G06T 13/40 (2011.01); G06T 19/20 (2011.01); G06V 40/10 (2022.01);
U.S. Cl.
CPC ...
G06T 1/20 (2013.01); G06N 3/08 (2013.01);
Abstract

A multi-node cluster-based inference method through GPU separation allocation of a pre-trained layer and a fine-tuning layer of multiple deep learning models. The method includes: receiving an input value from a client; distributing the received input value, and transmitting the first input value to a first computation node including a container in which a neural network bundle of a first stage is loaded; performing, by a first container of the first computation nodes, an operation through a neural network layer of a GPU by using the received first input value as an input, and generating a first output value; and selecting a container in which the neural network bundle of the next stage is loaded, and transmitting the second output value to the computation node that includes the container in which the next stage is to be executed or the container in which to execute the next stage.


Find Patent Forward Citations

Kim, Joon. (2026). Multi-node cluster-based inference method and system through gpu separate allocation of pre-trained layer and fine-tuning layer of multiple deep learning models (U.S. Patent No. 12688544). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12688544

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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