The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Apr. 21, 2025
Applicant:

Anumana, Inc., Cambridge, MA (US);

Inventors:

Arjun Puranik, San Jose, CA (US);

Nikhil Sachdeva, Murugeshpallya, IN;

Shashi Kant, Bengaluru, IN;

Rakesh Barve, Bengaluru, IN;

Colin Pawlowski, Cambridge, MA (US);

Assignee:

Anumana, Inc., Cambridge, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G06N 20/00 (2019.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G16H 50/20 (2018.01);
Abstract

An apparatus and method for improving functioning of a validated machine-learning model are disclosed. The apparatus includes a computing device having a processor and a memory, the memory containing instructions that, when run, configure the processor to receive a validated machine-learning model that has been trained on a validated training set, wherein the validated machine-learning model includes a first form accuracy metric, receive a paired data set including a plurality of data pairs of first form data paired with second form data and determine that a second form accuracy metric exceeds an accuracy threshold as a function of comparison of a paired output for each data pair of a plurality of data pairs and the first form accuracy metric.


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