The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Jun. 09, 2023
Applicant:

The Toronto-dominion Bank, Toronto, CA;

Inventors:

Mahdi Ghelichi, Toronto, CA;

Talieh Tabatabaei, Richmond Hill, CA;

Julie R. Melanson, Toronto, CA;

Jesse Cole Cresswell, Toronto, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/022 (2023.01); G06N 5/045 (2023.01);
U.S. Cl.
CPC ...
G06N 5/022 (2013.01); G06N 5/045 (2013.01);
Abstract

The disclosed embodiments include computer-implemented systems and processes that dynamically monitor variations in process explainability of within a distributed computing environment. For example, an apparatus may obtain first and second explainability data associated with corresponding first and second temporal intervals, and based on the first and second explainability data, determine a value of a metric that characterizes a variation in the explainability of a machine-learning process between the first and second temporal intervals. When the metric value is inconsistent an exception criterion, the apparatus may obtain at least one additional value of the metric associated with a third temporal interval, and when the at least one additional metric value is inconsistent with the exception criterion, the apparatus may perform operations that modify at least one of (i) a value of a process parameter of the machine-learning process or (ii) a composition of an input dataset of the machine-learning process.


Find Patent Forward Citations

Ghelichi, Mahdi. (2026). Dynamically monitoring variations in process explainability within a distributed computing environment (U.S. Patent No. 12688438). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12688438

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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