The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Apr. 20, 2023
Applicant:

Xilinx, Inc., San Jose, CA (US);

Inventors:

Alok Mistry, Hyderabad, IN;

Niloy Roy, Hyderabad, IN;

Shanish Chandra Mishra, Hyderabad, IN;

Anil Kumar A V, Hyderabad, IN;

Assignee:

XILINX, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/33 (2020.01); G06F 30/327 (2020.01); G06F 30/331 (2020.01); G06F 30/333 (2020.01); G06F 30/34 (2020.01); G06F 30/367 (2020.01); G06F 30/398 (2020.01); H03K 19/02 (2006.01); G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/26 (2006.01);
U.S. Cl.
CPC ...
G06F 30/33 (2020.01); G06F 30/327 (2020.01); G06F 11/008 (2013.01); G06F 11/0766 (2013.01); G06F 11/261 (2013.01); G06F 30/331 (2020.01); G06F 30/333 (2020.01); G06F 30/34 (2020.01); G06F 30/367 (2020.01); G06F 30/398 (2020.01); H03K 19/02 (2013.01);
Abstract

Disclosed methods and systems include debug circuitry registering candidate sample values in a plurality of sample periods while application circuitry is active. The candidate sample values indicate states of a plurality of candidate signals of the application circuitry. Sample values of first probed signals from each sample period are written to a sample memory using a mapping based on bit-widths of the first probed signals. The sample values of the first probed signals are selected from the candidate sample values. The mapping is updated based on bit-widths of second probed signals, and sample values of the second probed signals from each sample period are written to the sample memory using the mapping. The sample values of the second probed signals are selected from the candidate sample values.


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